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Electronics

News and Updates

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PML Scientists Develop 3D SEM Metrology for 10 nm Structures

March 21, 2014

PML researchers have devised an idea for determining the three-dimensional shape of features as small as 10 nanometers wide. The model-based method compares

Cell Phones and Cable Signals: Interference Can Happen

March 20, 2014

When your cell phone talks to your cable TV connection, the conversation can get ugly. In certain conditions, broadband 4G/LTE signals can cause significant

Portable Frequency Comb Rolls Out of the Lab

March 20, 2014

A PML team is hitting the road with a fine-tooth comb. Scientists in the Quantum Electronics and Photonics Division have devised a portable optical frequency

Demagnetization Dynamics on a Femtosecond Time Scale

March 20, 2014

There are many unknowns in the future of computing. But one thing is certain: Devices will be reading and writing information faster, and storing it at ever

NIST Chips Help BICEP2 Telescope Find Direct Evidence of Origin of the Universe

March 18, 2014

Editor’s Note (Feb. 3, 2025): After this NIST news article was published, the BICEP2 team members found an error in their analysis and retracted their

Magnetic Attraction: Physicists Pay Homage to the SQUID at 50

March 11, 2014

From humble beginnings in a series of accidental discoveries, SQUIDs have invaded and enhanced many areas of science and medicine, thanks, in part, to the

JILA Physicists Discover 'Quantum Droplet' in Semiconductor

February 26, 2014

JILA physicists used an ultrafast laser and help from German theorists to discover a new semiconductor quasiparticle—a handful of smaller particles that briefly

Stirred, Then Shaken: NIST Atomtronic Study May Pave the Way for New Devices

February 19, 2014

While pursuing the goal of turning a cloud of ultracold atoms into a completely new kind of circuit element, physicists at the National Institute of Standards

Nearly Everyone Uses Piezoelectrics. Be Nice to Know How They Work.

January 29, 2014

Piezoelectrics—materials that can change mechanical stress to electricity and back again—are everywhere in modern life. Computer hard drives. Loud speakers

MML Researcher R. Joseph Kline Receives Presidential Early Career Award for Scientists and Engineers

January 15, 2014

Material Measurement Laboratory researcher R. Joseph Kline was recently named among the 102 recipients of the Presidential Early Career Awards for Scientists

President Obama Announces New Public-Private Manufacturing Innovation Institute

January 15, 2014

WASHINGTON, DC – The President today will announce new steps with the private sector to strengthen the manufacturing sector, boost advanced manufacturing, and

keys illustration to denote a new "one-shot" memory device

Quantum Physics Could Make Secure, Single-Use Computer Memories Possible

January 14, 2014

Computer security systems may one day get a boost from quantum physics, as a result of recent research from the National Institute of Standards and Technology

High-Tech Measurements for High-Frequency Antennas

November 14, 2013

A team of researchers at NIST's Antenna Metrology Lab in Boulder, CO has devised a first-of-its-kind system – combining a precision 3-meter industrial robot arm

Perfect Faults: A Self-Correcting Crystal May Unleash the Next Generation of Advanced Communications

November 5, 2013

Researchers from the National Institute of Standards and Technology (NIST) have joined with an international team to engineer and measure a potentially

NIST/JQI Team 'Gets the Edge' on Photon Transport in Silicon

October 22, 2013

Scientists have a new way to edge around a difficult problem in quantum physics, now that a research team from the National Institute of Standards and

NTIA and NIST to host Innovative Spectrum Sharing Technology Day Event

October 21, 2013

Additional Contact: Juliana Gruenwald, NTIA, 202-482-2145 WASHINGTON – The U.S. Commerce Department's National Telecommunications and Information Administration

NIST Unveils Prototype Video Imaging System for Remote Detection of Hidden Threats

September 30, 2013

By adapting superconducting technology used in advanced telescope cameras, researchers at the National Institute of Standards and Technology (NIST) have built a

The Persistence of Memory: Looking into MRAM

August 5, 2013

Many in the electronics industry want to change how memories are made. So PML scientists are exploring the physics and developing the metrology required to do

NIST Chip Measurement Advance Earns 'Oscar of Innovation'

July 12, 2013

A fundamental advance in measurement capabilities that could save semiconductor manufacturers billions of dollars annually has earned a 2013 R&D 100 Award for

Microscopy Technique Could Help Computer Industry Develop 3-D Components

June 25, 2013

A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has been applied to

Protecting the Nation's Critical Infrastructure

June 20, 2013

Guest blog post by Patrick Gallagher, Under Secretary of Commerce for Standards and Technology and Director, National Institute of Standards and Technology Just

Multiple views of NIST's photoelectrochemical hydrogen cell.

NIST Demonstrates Significant Improvement in the Performance of Solar-Powered Hydrogen Generation

May 14, 2013

Using a powerful combination of microanalytic techniques that simultaneously image photoelectric current and chemical reaction rates across a surface on a

New 3D Defect Detection Fills Important Industry Gap

May 13, 2013

As device manufacturing technologies sizes shrink beyond 22 nm and increase in complexity, defects become more detrimental to device performance and harder to

New Temporal Filtering Technique Improves Solid-State Single Photon Sources

May 8, 2013

An international collaboration led by researchers from the NIST Center for Nanoscale Science and Technology (CNST) has demonstrated a novel temporal filtering

PML Researchers Open Door to Advanced Molecular Electronic Metrology

April 12, 2013

Continued advancements using a NIST-developed molecular-level fabrication technique are leading to new discoveries in the metrology for molecular electronics by

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