Join us for a webinar hosted by the CHIPS Metrology Program. Marla Dowell, director of the CHIPS Metrology Program, will discuss how CHIPS for America advances metrology research essential for next-generation microelectronics. In support of this goal, the program develops accurate measurements for microelectronic materials and systems, addressing industry challenges and improving standards and practices in semiconductor manufacturing. In addition, we will showcase select research teams and their groundbreaking work.
Featured NIST researchers and their CHIPS Metrology projects are: