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Inside CHIPS Metrology: Research that Accelerates Innovation

Square with rounded edges. Fill of square looks like American flag. Coming off the sides of the square are lines with unfilled circles at end. Words underneath: CHIPS for AMERICA

Join us for a webinar hosted by the CHIPS Metrology Program. Marla Dowell, director of the CHIPS Metrology Program, will discuss how CHIPS for America advances metrology research essential for next-generation microelectronics. In support of this goal, the program develops accurate measurements for microelectronic materials and systems, addressing industry challenges and improving standards and practices in semiconductor manufacturing.  In addition, we will showcase select research teams and their groundbreaking work.  

Featured NIST researchers and their CHIPS Metrology projects are:  

Don't miss this chance to engage with these experts in interactive discussions, pose your questions, and explore the forefront of metrology advancements shaping the future of microelectronics.  

Created January 5, 2024, Updated January 16, 2024