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Current Status and Future Perspective of In-Situ Electron Microscopy for Electronic and Quantum Materials

Current Status and Future Perspective of in-Situ Electron Microscopy Banner

New developments in electron microscopy (EM) instrumentation now enable the observation and measurement of nanoscale processes in electronic and quantum materials for in situ/operando experiments. These experiments can provide fundamental insight into the structure, chemistry, and functionality of materials in their native or working conditions, measured at high spatial resolution and under various stimuli, such as heat, light, biasing, and liquid/gas environments. This one-day virtual workshop organized by the Environmental Transmission Electron Microscopy (ETEM) Team at the National Institute of Standards and Technology (NIST) will provide a platform for sharing the state-of-the-art electron microscopy techniques that capture dynamic processes in electronic and quantum materials, and drawing attention to the emerging technologies in data acquisition and analysis. We will use the open discussion panel to identify current challenges and opportunities in the field, which could be addressed using the available tools. This workshop recognizes the frontier research in the field of in-situ transmission electron microscopy and the future horizon focused on electronic and quantum materials, in honor of the multimodal approach for ETEM pioneered by Dr. Renu Sharma, who retired from NIST in November 2019. Renu has been a long-time advocate in the research fields of materials science and electron microscopy. Her contribution to in-situ electron microscopy is unparalleled. The format of the workshop will include live-streaming lectures given by the invited speakers, and an open discussion panel.  

Invited Speakers and Lectures 


Eric A. Stach, University of Pennsylvania
Understanding phase transitions in transition metal dichalcogenides with in-situ STEM methods


Eli Sutter, University of Nebraska, Lincoln
Combined Imaging, Nano Beam Diffraction and Cathodoluminescence Spectroscopy of Two-Dimensional/Layered Crystals and Nanowires


Raymond Unocic, Oak Ridge National Laboratory
Atomic Engineering of 2D Materials: Insights from In Situ STEM Experiments, Theory and Functional Properties

Sergei V. Kalinin, Oak Ridge National Laboratory 
Post-correlative machine learning in STEM: applications for materials design and atomic fabrication

David W. McComb, Ohio State University
Monochromated electron energy-loss spectroscopy of functional materials in the scanning transmission electron microscope.

James M. Lebeau, Massachusetts Institute of Technology
In-Situ STEM Imaging of Functional Oxides, from Surfaces to Domain Dynamics

Organizing Committee

Hsin-Yun (Joy) Chao, NIST

Andrew Herzing, NIST

Andrei Kolmakov, NIST

Kerry Siebein, NIST

Wei-Chang (David) Yang, NIST


 

Time (EST)

Time (PDT)

7/13 (Monday)

10:30-10:40 am

7:30 - 7:40 am

Welcome remarks

10:40 -11:10 am

7:40- 8:10 am

Eric A. Stach, University of Pennsylvania

Understanding phase transitions in transition metal dichalcogenides with in-situ STEM methods

11:10 -11:40 am

8:10 - 8:40 am

Eli Sutter, University of Nebraska, Lincoln

Combined Imaging, Nano Beam Diffraction and Cathodoluminescence Spectroscopy of Two-Dimensional/Layered Crystals and Nanowires

11:40-12:10 pm

8:40-9:10 am

Raymond Unocic, Oak Ridge National Laboratory

Atomic Engineering of 2D Materials:

Insights from In Situ STEM Experiments, Theory and Functional Properties

12:10 - 12:40 pm

9:10 - 9:40 am

Open Panel Discussion

12:40 - 1:20 pm

9:40- 10:20 am

Lunch Break

1:20-1:50 pm

10:20 -10:50 am

Sergei V. Kalinin, Oak Ridge National Laboratory

Post-correlative machine learning in STEM: applications for materials design and atomic fabrication

1:50-2:20 pm

10:50 -11:20 am

David W. McComb, Ohio State University

Monochromated electron energy-loss spectroscopy of functional materials in the scanning transmission electron microscope.

2:20 -2:50 pm

11:20 -11:50 am

James M. Lebeau, Massachusetts Institute of Technology

In-Situ STEM Imaging of Functional Oxides, from Surfaces to Domain Dynamics

2:50 -3:20 pm

11:50 -12:20 pm

Open Panel Discussion

 

Created June 16, 2020, Updated June 22, 2020