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Wei-Chang D. Yang (Fed)

Materials Research Engineer

Dr. Wei-Chang (David) Yang is a materials research engineer in the Nanoscale Device Characterization Division of the Physical Measurement Laboratory at the National Institute of Standards and Technology (NIST). He received his bachelor’s and master’s degrees from the National Tsing Hua University, Taiwan, and his Ph.D. in Materials Engineering from Purdue University. He conducted his postdoctoral research developing in situ and operando methods for TEM to measure dynamic processes under the supervision of Dr. Renu Sharma at NIST, where he is currently employed. His current research focuses on discovering light-matter interactions using correlative electron and photon beams at gas-solid interfaces. The interfacial structures and optoelectronic properties potentially impact photocatalysis, photovoltaic, and nanoelectronic fabrication applications. He was awarded the Early Career Award from the Nanometer-scale Science and Technology Division of the American Vacuum Society in 2019 for his work that elucidates the critical structural features in plasmonic antennae resulting in photochemistry that induces chemical reactions without the need of additional heat. He was also one of the Microscopy Society of America’s Postdoctoral Scholar Award awardees in 2019. His research interest involves advancing measurement techniques for environmental transmission electron microscopy that combines Raman spectroscopy, photoluminescence with electron spectroscopy, diffraction, and high-resolution imaging to solve materials research problems.

Selected Programs/Projects

In Situ Measurements of Thermodynamics and Reaction Kinetics During Synthesis and Functioning of Nanomaterials Using Transmission Electron Microscopy Based Techniques


Towards data-driven next-generation transmission electron microscopy

Steven R. Spurgeon, Colin Ophus, Lewys Jones, Amanda K. Petford-Long, Sergei Kalinin, Matthew J. Olszta, Rafal Dunin-Borkowski, Norman Salmon, Khalid Hattar, Wei-Chang Yang, Renu Sharma, Yingge Du, Ann Chiaramonti Debay, Haimei Zheng, Edgar C. Buck, Libor Kovarik, R. Lee Penn, Dongsheng Li, Xin Zhang, Mitsuhiro Murayama, Mitra D. Taheri
The rapidly evolving field of electron microscopy touches nearly every aspect of modern life, underpinning impactful materials discoveries in applications such
Created July 30, 2019, Updated December 8, 2022