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Reference Data
The Materials Measurement Science Division has developed and maintained 16 SRD products to validate existing methods and enable realization of new technologies. Please visit the full SRD Catalog to see other SRD products. The SRD databases may include data from the literature, NIST research, or both, all critically evaluated by NIST. The databases are listed below by number reflecting the order in which they were released. Some of the databases have been developed in partnership with other organizations.
Standard Reference Data Products
| SRD Number | Description | Contact |
|---|---|---|
| SRD 3 | NIST Inorganic Crystal Structure Database (ICSD) | Igor Levin |
| SRD 20 | NIST X-ray Photoelectron Spectroscopy Database | Justin Gorham |
| SRD 30 | NIST Structural Ceramics Database (SCD) Database | Igor Levin |
| SRD 31 | ACerS-NIST Phase Equilibria Diagrams Database | Terrell Vanderah |
| SRD 62 | NIST High Temp. Superconducting Materials (HTS) Database | Igor Levin |
| SRD 64 | NIST Electron Elastic-Scattering Cross-Section Database | Cedric Powell |
| SRD 71 | NIST Electron Inelastic-Mean-Free-Path Database | Cedric Powell |
| SRD 82 | NIST Electron Effective-Attenuation-Length Database | Cedric Powell |
| SRD 83 | NIST Structural Database | Igor Levin |
| SRD 84 | FIZ/NIST Inorganic Crystal Structure Database (ICSD) | Igor Levin |
| SRD 100 | NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) | Cedric Powell |
| SRD 137 | Fracture Toughness / Fracture Energy Data for Oxide Glass | Igor Levin |
| SRD 138 | Fracture Toughness / Fracture Energy Data for Ceramics | Igor Levin |
| SRD 150 | NIST Property Data Summaries for Advanced Materials | Igor Levin |
| SRD 154 | NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy | Cedric Powell |
| SRD 164 | NIST Database of Cross Sections for Inner-Shell Ionization by Electron or Positron Impact | Cedric Powell |