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Reference Data

The Materials Measurement Science Division has developed and maintained 16 SRD products to validate existing methods and enable realization of new technologies. Please visit the full SRD Catalog to see other SRD products. The SRD databases may include data from the literature, NIST research, or both, all critically evaluated by NIST. The databases are listed below by number reflecting the order in which they were released. Some of the databases have been developed in partnership with other organizations.

Standard Reference Data Products

SRD Number Description Contact
SRD 3 NIST Inorganic Crystal Structure Database (ICSD) Igor Levin
SRD 20 NIST X-ray Photoelectron Spectroscopy Database Justin Gorham
SRD 30 NIST Structural Ceramics Database (SCD) Database Igor Levin
SRD 31 ACerS-NIST Phase Equilibria Diagrams Database Terrell Vanderah
SRD 62 NIST High Temp. Superconducting Materials (HTS) Database Igor Levin
SRD 64 NIST Electron Elastic-Scattering Cross-Section Database Cedric Powell
SRD 71 NIST Electron Inelastic-Mean-Free-Path Database Cedric Powell
SRD 82 NIST Electron Effective-Attenuation-Length Database Cedric Powell
SRD 83 NIST Structural Database Igor Levin
SRD 84 FIZ/NIST Inorganic Crystal Structure Database (ICSD) Igor Levin
SRD 100 NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) Cedric Powell
SRD 137 Fracture Toughness / Fracture Energy Data for Oxide Glass Igor Levin
SRD 138 Fracture Toughness / Fracture Energy Data for Ceramics Igor Levin
SRD 150 NIST Property Data Summaries for Advanced Materials Igor Levin
SRD 154 NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy Cedric Powell
SRD 164 NIST Database of Cross Sections for Inner-Shell Ionization by Electron or Positron Impact Cedric Powell
Created March 8, 2023, Updated August 15, 2023