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Materials

Tools and Instruments

Keyword

Organizational Unit

Synchrotron X-ray Diffraction (XRD)

The X-ray diffraction (XRD) end station measures constructive interference of the x-ray wave with repeating atomic and interfacial structure in materials. At

SAMAD. (System for AM Metal Alloy Development )

System for AM Metal Alloy Development (SAMAD)

To accelerate the design of new alloys for additive manufacturing and to investigate alternate processing methods, a custom built laser powder-blown directed

The Solid-State NMR Facility

The newly renovated solid-state NMR facility at the NIST Material Measurement Laboratory houses two spectrometers, 300 MHz and 100 MHz, primarily used for

Thermogravimetric Analyzer

Thermogravimetric Analysis, or TGA, is a classic thermoanalytical measurement performed on many different types of materials. In our laboratory, it is used for

Ultrasonic Atomizer

To support alloy development for additive manufacturing (AM), a small lab-scale ultrasonic atomization system has been established for metallic powder

Vector Potential Photoelectron Microscope (VPPEM)

The Vector Potential Photoemission Microscope endstation sits at the end of both the SST-I and SST-II beamlines, providing both soft (0.1 keV to 2.2 keV) and

Picture of the sample area of the NIST X-ray Adsorbtion Fine Structure instrument, with NIST scientist Bruce Ravel, located at the National Synchrotron Light Source.

X-ray Absorption Fine Structure (XAFS)

The XAFS station uses a tunable, monochromatic, and moderately high energy X-ray beam (4.5 keV to 23.5 keV) for X-ray absorption spectroscopy measurements. The

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