The Helios 660 NanoLab(HNL660) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase measurements to be performed at high spatial resolution. The HNL660 operates between 1 keV and 30 keV electron beam energy and 2 kV and 30 kV ion beam accelerating voltage. The HNL660 has an Elstar thermal (Schottky) field emission electron source and a Tomahawk ion column using a Ga+ liquid metal ion source. It is used for 3D chemical imaging of organic samples and automated hyperspectral analytical method development. The HNL660 is also equipped with retractable STEM detector, cryo stage, nano manipulator, multiple gas injection systems, two EDS detectors, and an EBSD system.