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Projects/Programs

Displaying 51 - 52 of 52

Transfer and working standard radiometers and photometers

Ongoing
Reflectance-type silicon trap-detectors – Silicon trap-detectors have been developed for use as transfer standards for the IR-SIRCUS and IR-Laser Scatter and Detector Characterization facilities. They are built using either Hamamatsu S6337 or S1337 photodiodes. UV silicon trap-detectors have also...

Waveform Metrology Project

Ongoing
Optical measurement techniques: NIST uses the electro-optic sampling (EOS) technique to measure the vector response of photodiodes and provide phase traceability for commercial instrumentation, such as large-signal network analyzers, lightwave component analyzers, vector signal analyzers...
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