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Gaithersburg

ACMD Seminar: Architecture-dependent bifurcations and clustering in brain networks

Anca Radulescu Department of Mathematics, SUNY New Paltz Tuesday, April 13, 2021, 3:00 PM EDT (1:00 MDT) A video of this talk is available...

ACMD Seminar: Resolving the Shock Layer in Fixed-Bed Adsorption with Boundary Layer Theory

Robert DeJaco Applied and Computational Mathematics Division, ITL, NIST Tuesday, March 30, 2021, 3:00 PM EDT (1:00 PM MDT) A video of this...

2021 Federal Cybersecurity Workforce Summit (Virtual)

Tue, Apr 27 2021, 1:00 - 4:00pm EDT

The PowerPoint slides used during this webinar can be downloaded here. The Federal Cybersecurity Workforce Summit

SP 800-90B Entropy Source Validation Workshop

Tue, Apr 27 2021, 10:00am - Thu, Apr 29 2021, 2:30pm EDT

The workshop covers topics on the validation of entropy sources conforming to NIST SP 800-90B, with the goal of helping

Optical Properties of Materials

SUMMARY This program in the Sensor Science Division of NIST is directed towards developing improved optical materials measurement technology...

Basic Metrology: Comparison of NIST-1 and NIST-3 Standard Ampoules

Since the 1950s, the NIST Radioactivity Group has employed standardized 5 mL borosilicate glass ampoules for ionization chamber measurements and high-resolution

Basic Metrology: NIST-3 Standard Ampoules and Automatic Tip Sealing

Standard-sized ampoules for radioactive solution standards have been employed by the National Institute of Standards and Technology (NIST) for the past 70 years

Basic Metrology: Recent Primary SRM Standardizations

Following is a tabulation of the primary standardizations of Radioactivity SRMs performed over the past decade.

A measurement-based approach to 5G supply chain security

Revolutionizing the American economy comes from advancements in communication networks that enable a fully connected world through millions of devices providing

Text Analysis Conference

There has been a growing recognition of the importance of community-wide evaluations for research in information technologies. The Text Analysis Conference is a

ACMD Seminar: Model-free forecasting with applications to multi-sensor arrays

Tyrus Berry Department of Mathematical Sciences, George Mason University Tuesday, March 16, 2021, 3:00 PM EST (1:00 PM MST) A video of this...

Masks Under the Microscope

March 9, 2021

To understand how something works, it helps to see it up close. A team of researchers took this approach when studying

Jim Olthoff’s Remarks for the Feb. 10 Community Meeting

February 10, 2021

Referenced Speaker

James K. Olthoff

Remarks as prepared. Thank you all for joining us this evening. I’m sorry for the short notice of this meeting, but we wanted to schedule it as soon as we could...

NIST Shares Key Practices in Cyber Supply Chain Risk Management Based on Observations from Industry

February 22, 2021

A new publication from the National Institute of Standards and Technology (NIST) provides companies, government agencies, and other organizations with a set of

A Better Way to Measure Acceleration

March 8, 2021

You’re going at the speed limit down a two-lane road when a car barrels out of a driveway on your right. You slam on the brakes, and within a fraction of a

NICE Webinar: Advancing Skills-Based Education and Hiring Through the Open Skills Network

Wed, Mar 17 2021, 2:00 - 3:00pm EDT

The PowerPoint slides used during this webinar can be downloaded here. Download the Continuing Education Units form

Ram D. Sriram Named Recipient of a 2021 Distinguished Alumni Award from the Indian Institute of Technology, Madras

The Distinguished Alumnus Award (DAA) is the highest award given by IIT Madras to its alumni in recognition of their achievements in their

Toman, Ma, and Nelson Received the CITAC Best Paper of 2020 Award

Blaza Toman and Yong Ma of the Information Technology Laboratory, along with Michael A. Nelson from the Material Measurement Laboratory

Not Just a Pretty Facet: New NIST algorithm for NV center diamond magnetometry speeds up experiments by an order of magnitude

February 19, 2021

Some might call it a diamond in the rough: NV center magnetometry, which uses specially adapted diamonds to make sensitive measurements of magnetic signals, is

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Gaithersburg

ACMD Seminar: Architecture-dependent bifurcations and clustering in brain networks

ACMD Seminar: Resolving the Shock Layer in Fixed-Bed Adsorption with Boundary Layer Theory

2021 Federal Cybersecurity Workforce Summit (Virtual)

SP 800-90B Entropy Source Validation Workshop

Optical Properties of Materials

Basic Metrology: Comparison of NIST-1 and NIST-3 Standard Ampoules

Basic Metrology: NIST-3 Standard Ampoules and Automatic Tip Sealing

Basic Metrology: Recent Primary SRM Standardizations

A measurement-based approach to 5G supply chain security

Text Analysis Conference

ACMD Seminar: Model-free forecasting with applications to multi-sensor arrays

Masks Under the Microscope

Jim Olthoff’s Remarks for the Feb. 10 Community Meeting

NIST Shares Key Practices in Cyber Supply Chain Risk Management Based on Observations from Industry

A Better Way to Measure Acceleration

NICE Webinar: Advancing Skills-Based Education and Hiring Through the Open Skills Network

Ram D. Sriram Named Recipient of a 2021 Distinguished Alumni Award from the Indian Institute of Technology, Madras

Toman, Ma, and Nelson Received the CITAC Best Paper of 2020 Award

Not Just a Pretty Facet: New NIST algorithm for NV center diamond magnetometry speeds up experiments by an order of magnitude

2019 IEC 1906 Award - Yan Lu

ASME ECLIPSE Intern - Mike Brundage

Lisa Choe, Selvarajah Ramesh, Xu Dai, Matthew Hoehler, and Matthew Bundy were Awarded Best Paper

Adam Jacoff is Recognized by Homeland Security Today

Brandon Lane is Recognized as the 2020 Reviewer of the Year

Trial by Fire: A Look at NIST Fire Testing Through the Years

Radiation Sensitivity of Thermoluminescent Dosimeter Sensors

5735 NIST Handbook 133 - How to Test Animal Bedding

5734 Weights and Measures Inspections - Evidence, Search and Seizure, and Due Process

5733 NIST Handbook 133 - Overview of Handbook 133

5732 NIST Handbook 130 - Overview of the Uniform Packaging and Labeling Regulation