Hubbard, C.
, Stewart, J.
, Zhang, Y.
, Morosin, B.
and Venturini, E.
(1988),
XRAYL ::a powder diffraction profile refinement program, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.88-3850
(Accessed February 15, 2025)