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X-Ray Reflectivity of Interface Roughness Correlated with Transport Properties of (AlGa)As/GaAs High Electron Mobility Transistor Devices

Published

Author(s)

Joseph Dura, Joseph G. Pellegrino, Curt A. Richter
Citation
Applied Physics Letters
Volume
69
Issue
8

Citation

Dura, J. , Pellegrino, J. and Richter, C. (1996), X-Ray Reflectivity of Interface Roughness Correlated with Transport Properties of (AlGa)As/GaAs High Electron Mobility Transistor Devices, Applied Physics Letters (Accessed April 23, 2024)
Created August 18, 1996, Updated October 12, 2021