TY - JOUR AU - Joseph Dura AU - Joseph Pellegrino AU - Curt Richter C2 - Applied Physics Letters DA - 1996-08-19 00:08:00 LA - en M1 - 69 PB - Applied Physics Letters PY - 1996 TI - X-Ray Reflectivity of Interface Roughness Correlated with Transport Properties of (AlGa)As/GaAs High Electron Mobility Transistor Devices ER -