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X-Ray microbeam measurements of long range internal stresses in commercial purity aluminum processed by multiple passes of equal-channel angular pressing

Published

Author(s)

Lyle E. Levine, Thien Phan, I-Fang Lee, Jonathan Z. Tischler, Huang Yi, Alan G. Fox, Terrance G. Langdon, Mike Kassner

Abstract

X-ray microbeam diffraction was used to measure long range internal stresses (LRIS) in the grain/subgrain interiors of commercial purity aluminum processed by equal-channel angular pressing for up to 8 passes. The LRIS values at +4.9o off the axial (pressing) direction show only a slight increase with increasing numbers of passes. The normalized stress remains approximately constant at ≈ 0.10 of the flow stress.
Citation
Scripta Materialia

Keywords

microbeam diffraction, ECAP, residual stress

Citation

Levine, L. , Phan, T. , Lee, I. , Z., J. , Yi, H. , Fox, A. , Langdon, T. and Kassner, M. (2014), X-Ray microbeam measurements of long range internal stresses in commercial purity aluminum processed by multiple passes of equal-channel angular pressing, Scripta Materialia (Accessed April 22, 2024)
Created December 15, 2014, Updated February 19, 2017