Levine, L.
, Phan, T.
, Lee, I.
, Z., J.
, Yi, H.
, Fox, A.
, Langdon, T.
and Kassner, M.
(2014),
X-Ray microbeam measurements of long range internal stresses in commercial purity aluminum processed by multiple passes of equal-channel angular pressing, Scripta Materialia
(Accessed October 14, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
X-Ray microbeam measurements of long range internal stresses in commercial purity aluminum processed by multiple passes of equal-channel angular pressing
Published
Author(s)
, Thien Phan, I-Fang Lee, Jonathan Z. Tischler, Huang Yi, Alan G. Fox, Terrance G. Langdon, Mike Kassner
Abstract
X-ray microbeam diffraction was used to measure long range internal stresses (LRIS) in the grain/subgrain interiors of commercial purity aluminum processed by equal-channel angular pressing for up to 8 passes. The LRIS values at +4.9o off the axial (pressing) direction show only a slight increase with increasing numbers of passes. The normalized stress remains approximately constant at ≈ 0.10 of the flow stress.Citation
Scripta Materialia
Pub Type
Journals
Keywords
microbeam diffraction, ECAP, residual stress
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 15, 2014, Updated February 19, 2017