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X-Ray Diffraciton and the Existence of Long Range Internal Stresses

Published

Author(s)

M A. Delos-Reyes, M E. Kassner, Lyle E. Levine

Abstract

Long range internal stresses (LRIS) are often used to explain various aspects of the mechanical behavior of materials. Recent experiments by the authors indicate an absence of measurable LRIS. X-ray line asymmetry, however, has long been interpreted as an argument in favor of the existence of LRIS. The literature in this area are reanalyzed and new computer simulations of diffraction peaks in dislocated crystals are discussed. It was found that there is more than one explanation for x-ray line asymmetry, and that LRIS is not required.
Citation
International Symposium on Plasticity and Its Current Applications

Keywords

dislocations, internal stresses, x-ray diffraction

Citation

Delos-Reyes, M. , Kassner, M. and Levine, L. (2021), X-Ray Diffraciton and the Existence of Long Range Internal Stresses, International Symposium on Plasticity and Its Current Applications (Accessed December 1, 2021)
Created October 12, 2021