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PUBLICATIONS

A Well Dressed Microscope: Practical Experience With Microcalorimeter and Silicon Drift Detector Systems

Published

Author(s)

John A. Small, Dale E. Newbury, J H. Scott, L R. King, Sae Woo Nam, Kent D. Irwin, Steven Deiker, S Barkan, E Iwaniczko

Abstract

NIST, Gaithersburg has recently installed a first generation silicon drift dectector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer ( cal-EDS) on a JEOL 840 SEM1 , as shown in Fig.1. [1,2] The instrument is also equipped with a conventional Si-Li x-ray detector (LINK ISIS 3 position turret) and a JEOL wavelength dispersive x-ray spectrometer. NIST, Gaithersburg staff have had the opportunity to work with these new detector tecnologies as users and to compare preliminary results with conventional systems.
Citation
Microscopy and Microanalysis
Volume
8
Issue
Suppl. 2
Pub Type
Journals

Keywords

instrument, JEOL wavelength dispersive x-ray spectro, microcalorimeter, silcon drift detector systems

Citation

Small, J. , Newbury, D. , Scott, J. , King, L. , Nam, S. , Irwin, K. , Deiker, S. , Barkan, S. and Iwaniczko, E. (2002), A Well Dressed Microscope: Practical Experience With Microcalorimeter and Silicon Drift Detector Systems, Microscopy and Microanalysis (Accessed December 3, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 1, 2002, Updated February 17, 2017