Published: April 09, 2018
Ndubuisi G. Orji, Yaw S. Obeng, Carlos Beitia, Supika Mashiro, James Moyne
This white paper provides an overview of virtual metrology (VM) and the benefits it can provide, with cost reduction (both capital expenditure and cycle time) being the primary benefit. The white paper also examines some of the issues preventing wider adoption of VM, and offers some possible solutions. The key adoption issues identified in this white paper primarily came from a survey of advanced process control (APC) users, implementers, and managers, conducted by the International Roadmap for Devices and Systems (IRDS) Factory Integration focus team, to help understand the current state of VM adoption.
Citation: IEEE-INTERNATIONAL ROADMAP FOR DEVICES AND SYSTEMS (IRDS)
Pub Type: Others
VIRTUAL METROLOGY, REAL METROLOGY, YIELD, AUTOMATED PROCESS CONTROL, RUN TO RUN CONTROL (R2R), SMART SAMPLING
Created April 09, 2018, Updated February 22, 2019