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PUBLICATIONS

Variability of Sounder Measurements in Manufacturing Facilities

Published

Author(s)

Jeanne Quimby, Alexandra Curtin, David R. Novotny, Chih-Ming Wang, Rick Candell

Abstract

Uncertainties in the linear regression fit of Path Loss are derived from variability in position. These uncertainties are used to determine the required positional accuracy for channel sounder measurements.
Proceedings Title
Variability of Sounder Measurements in Manufacturing Facilities
Conference Dates
June 26-July 1, 2016
Conference Location
fajardo, PR, US
Conference Title
Institute of Electrical and Electronics Engineers (IEEE) Antenna and Propagation Society (AP-S) conference
Pub Type
Conferences

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Local Download

Keywords

Channel Sounders, Microwave Measurement, Uncertainty Analysis, Wireless System
Wireless (RF)

Citation

Quimby, J. , Curtin, A. , Novotny, D. , Wang, C. and Candell, R. (2016), Variability of Sounder Measurements in Manufacturing Facilities, Variability of Sounder Measurements in Manufacturing Facilities, fajardo, PR, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920461 (Accessed October 8, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 27, 2016, Updated April 6, 2022