The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters.
Citation: IEEE Transactions on Instrumentation and Measurement
Pub Type: Journals
amplifier noise, measurement uncertainty, Monte Carlo, noise measurement, noise figure, noise parameters, transistor noise, uncertainty