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Uncertainty Analysis for Noise-Parameter Measurements at NIST

Published

Author(s)

James P. Randa

Abstract

The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters.
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
58
Issue
No:4

Keywords

amplifier noise, measurement uncertainty, Monte Carlo, noise measurement, noise figure, noise parameters, transistor noise, uncertainty

Citation

Randa, J. (2009), Uncertainty Analysis for Noise-Parameter Measurements at NIST, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33026 (Accessed May 28, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 9, 2009, Updated February 19, 2017