Randa, J.
(2009),
Uncertainty Analysis for Noise-Parameter Measurements at NIST, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33026
(Accessed April 26, 2025)
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Uncertainty Analysis for Noise-Parameter Measurements at NIST
Published
Author(s)
Abstract
The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters.Citation
IEEE Transactions on Instrumentation and Measurement
Volume
58
Issue
No:4
Pub Type
Journals
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Keywords
amplifier noise, measurement uncertainty, Monte Carlo, noise measurement, noise figure, noise parameters, transistor noise, uncertainty
Citation
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Created April 9, 2009, Updated February 19, 2017