Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Uncertainty Analysis of the Dual-Lift Use Case for the Industrial Wireless Testbed

Published

Author(s)

Karl Montgomery, Rick Candell, Mohamed Hany

Abstract

This report serves to characterize the uncertainty of measurements for key performance indicators (KPIs) used to measure the physical and network performance of the NIST industrial wireless dual-lift testbed. A review of the methods used to determine uncertainty is presented. We use the method known as the Guide to the Expression of Uncertainty in Measurement (GUM) to calculate the uncertainty values for each measurement. A description of the dual-lift use case and the KPIs are presented. The resulting expanded uncertainty values are calculated for the KPIs, which are the positional Cartesian error between the leader and follower robots, and the latency of the data packets associated with the informational transactions of the leader and follower's control loop. It is concluded that the measurement systems used in the dual-lift use case have relatively small uncertainty values for the detection of latency perturbations in the real-time control application implemented on the testbed.
Citation
Technical Note (NIST TN) - 2270
Report Number
2270

Keywords

Industrial wireless communications, Measurement uncertainty, Manufacturing

Citation

Montgomery, K. , Candell, R. and Hany, M. (2023), Uncertainty Analysis of the Dual-Lift Use Case for the Industrial Wireless Testbed, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.TN.2270, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956530 (Accessed December 10, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 2, 2023