Suehle, J.
(2000),
Ultra-Thin Film Dielectric Reliability Characterization, American Society for Testing and Materials, West Conshohocken, PA
(Accessed May 10, 2025)
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Ultra-Thin Film Dielectric Reliability Characterization
Published
Author(s)
Citation
Gate Dielectric Integrity
Publisher Info
American Society for Testing and Materials, West Conshohocken, PA
Pub Type
Books
Citation
Issues
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Created January 1, 2000, Updated January 27, 2020