Suehle, J.
(2000),
Ultra-Thin Film Dielectric Reliability Characterization, American Society for Testing and Materials, West Conshohocken, PA
(Accessed January 25, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Ultra-Thin Film Dielectric Reliability Characterization
Published
Author(s)
Citation
Gate Dielectric Integrity
Publisher Info
American Society for Testing and Materials, West Conshohocken, PA
Pub Type
Books
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 2000, Updated January 27, 2020