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Transport Characterization in Nanowires Using an Electrical Nanoprobe

Published

Author(s)

Albert A. Talin, Francois Leonard, Brian Swartzentruber, Samuel T. Picraux, Maria Eugenia Toimil-Molares, Jeffrey Cederberg, Xiaorui Wang, Stephen Hursee, A. Rishinaramangalum

Abstract

Abstract on original Form 114
Citation
Semiconductor Science and Technology
Volume
25

Keywords

semiconductor, nanowire, contacts, nanoprobe, space, charge, limited, conduction

Citation

Talin, A. , Leonard, F. , Swartzentruber, B. , Picraux, S. , , M. , Cederberg, J. , , X. , Hursee, S. and Rishinaramangalum, A. (2010), Transport Characterization in Nanowires Using an Electrical Nanoprobe, Semiconductor Science and Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903897 (Accessed May 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 22, 2010, Updated February 19, 2017