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PUBLICATIONS

Traceable Micro-Force Calibration for Instrumented Indentation Testing

Published

Author(s)

Douglas T. Smith, Gordon A. Shaw, Richard Seugling, Jon R. Pratt, Dan Xiang

Abstract

We describe the development, performance and application of an accurate SI-traceable force calibration and verification system for potential use in the field calibration of commercial instrumented indentation testing (IIT) instruments. The system consists of a capacitive force sensor, small enough to mount in any commercial IIT instrument as if it were a test specimen, used in conjunction with an ultra-high-accuracy capacitance bridge and a simple data recording computer. The system is calibrated with NIST-traceable masses over the range 5.0 µN through 5.0 mN. We present data on its accuracy and precision, as well its potential application to the calibration and verification of force in commercial instrumented indentation instruments.
Citation
Materials Science and Technology
Pub Type
Journals

Keywords

nanoindentation, force calibration, hardness testing
Polymers and Nanomaterials

Citation

Smith, D. , Shaw, G. , Seugling, R. , Pratt, J. and Xiang, D. (2007), Traceable Micro-Force Calibration for Instrumented Indentation Testing, Materials Science and Technology (Accessed March 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 13, 2007, Updated February 19, 2017