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Time Domain Testing Strategies and Fault Diagnosis for Analog Systems

Published

Author(s)

H Dai, T. M. Souders
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
39
Issue
1

Citation

Dai, H. and Souders, T. (1990), Time Domain Testing Strategies and Fault Diagnosis for Analog Systems, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=14783 (Accessed July 17, 2024)

Issues

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Created January 31, 1990, Updated October 12, 2021