Dai, H.
and Souders, T.
(1990),
Time Domain Testing Strategies and Fault Diagnosis for Analog Systems, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=14783
(Accessed December 1, 2024)
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Time Domain Testing Strategies and Fault Diagnosis for Analog Systems
Published
Author(s)
H Dai,
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
39
Issue
1
Pub Type
Journals
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Created January 31, 1990, Updated October 12, 2021