TY  - JOUR
AU  - H Dai
AU  - T. Souders
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 1990-02-01 00:02:00
LA  - en
M1  - 39
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 1990
TI  - Time Domain Testing Strategies and Fault Diagnosis for Analog Systems
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=14783
ER  -