Cassard, J.
, Cresswell, M.
, Hood, C.
, Linholm, L.
and Roitman, P.
(1993),
The Test Guide for CMOS-on-SIMOX Test Chips NIST3 and NIST4, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed April 24, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
The Test Guide for CMOS-on-SIMOX Test Chips NIST3 and NIST4
Published
Author(s)
, , , ,
Citation
NIST Interagency/Internal Report (NISTIR) -
Volume
4890
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1992, Updated October 12, 2021