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Temperature Dependent Complex Permittivity Measurements of Los-Loss Dielectric Substrates Using a Split-Cylinder Resonator

Published

Author(s)

Michael D. Janezic, Timothy Mobley, Daniel Amey

Abstract

The relative permittivity and loss tangent of cross-linked polystyrene, fused silica glass, and low-temperature co-fired (LTCC) ceramic substrated have been measured overa temperature range of -50 to 100 oC using a split-cylinder resonator operating at microwave frequencies. Althought the realtive permittivity of these substrates changed little over this temperature range, we observed significant variations of the loss tangent as a function of temperature.
Conference Dates
April 24-27, 2006
Conference Location
Denver, CO, USA
Conference Title
IMAPS/ACerS International Conference and Exhibition or Ceramic Interconnect and Ceramic Microsystems Technologies (CICM)

Keywords

relative permittivity, loss tangent, cavity dielectric, temperature, resonator

Citation

Janezic, M. , Mobley, T. and Amey, D. (2006), Temperature Dependent Complex Permittivity Measurements of Los-Loss Dielectric Substrates Using a Split-Cylinder Resonator, IMAPS/ACerS International Conference and Exhibition or Ceramic Interconnect and Ceramic Microsystems Technologies (CICM), Denver, CO, USA (Accessed February 27, 2024)
Created April 26, 2006, Updated October 12, 2021