Janezic, M.
, Mobley, T.
and Amey, D.
(2006),
Temperature Dependent Complex Permittivity Measurements of Los-Loss Dielectric Substrates Using a Split-Cylinder Resonator, IMAPS/ACerS International Conference and Exhibition or Ceramic Interconnect and Ceramic Microsystems Technologies (CICM), Denver, CO, USA
(Accessed May 18, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Temperature Dependent Complex Permittivity Measurements of Los-Loss Dielectric Substrates Using a Split-Cylinder Resonator
Published
Author(s)
, Timothy Mobley, Daniel Amey
Abstract
The relative permittivity and loss tangent of cross-linked polystyrene, fused silica glass, and low-temperature co-fired (LTCC) ceramic substrated have been measured overa temperature range of -50 to 100 oC using a split-cylinder resonator operating at microwave frequencies. Althought the realtive permittivity of these substrates changed little over this temperature range, we observed significant variations of the loss tangent as a function of temperature.Conference Dates
April 24-27, 2006
Conference Location
Denver, CO, USA
Conference Title
IMAPS/ACerS International Conference and Exhibition or Ceramic Interconnect and Ceramic Microsystems Technologies (CICM)
Pub Type
Conferences
Keywords
relative permittivity, loss tangent, cavity dielectric, temperature, resonator
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created April 26, 2006, Updated October 12, 2021