Brenner, D.
(1971),
A technique for measuring the surface temperature of transistors by means of fluorescent phosphor:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.591
(Accessed March 13, 2025)
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A technique for measuring the surface temperature of transistors by means of fluorescent phosphor:
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Author(s)
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- NBS TN 591
Report Number
NBS TN 591
Pub Type
NIST Pubs
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Created January 1, 1971, Updated May 19, 2023