TY - GEN AU - David J Brenner C2 - , National Institute of Standards and Technology, Gaithersburg, MD DA - 1971-01-01 05:01:00 DO - https://doi.org/10.6028/NBS.TN.591 LA - en PB - , National Institute of Standards and Technology, Gaithersburg, MD PY - 1971 TI - A technique for measuring the surface temperature of transistors by means of fluorescent phosphor: ER -