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TDR Permittivity Measurements of Dielectric Films

Published

Author(s)

Jan Obrzut, R Nozaki

Abstract

We have developed a time-domain reflectometry (TDR) technique to measure the dielectric permittivity of film specimens. The test specimen consists of a planar capacitor terminating coaxial waveguide. The complex permittivity is obtained from analysis of the incident and the reflected voltage waves. In order to improve accuracy at higher frequencies, the lumped element model is corrected of the wave propagation in the specimen section. The applicability of the method has been verified at frequencies from 100 MHz to 10 GHz on several polymer composite films, 40 mm to 100 mm thick, having a dielectric constant ranging from 4 to 40. When compared to other techniques, TDR provides a more intuitive and direct insight into capacitance density and impedance characteristics, which is very useful in high-frequency characterization of embedded passive devices.
Proceedings Title
Instrumentation and Measurement Technology Conference, 2006, IMTC 2006, Proceedings of the IEEE
Conference Dates
April 24-26, 2006
Conference Location
Sorento, IT
Conference Title
IEEE Conference on Instrumentation and Measurement, IMTC 06

Keywords

dielectric materials, high frequency measurements, TDR

Citation

Obrzut, J. and Nozaki, R. (2006), TDR Permittivity Measurements of Dielectric Films, Instrumentation and Measurement Technology Conference, 2006, IMTC 2006, Proceedings of the IEEE, Sorento, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852848 (Accessed April 15, 2024)
Created May 15, 2006, Updated February 17, 2017