TDR Permittivity Measurements of Dielectric Films

Published

May 15, 2006

Author(s)

Jan Obrzut, R Nozaki

Abstract

We have developed a time-domain reflectometry (TDR) technique to measure the dielectric permittivity of film specimens. The test specimen consists of a planar capacitor terminating coaxial waveguide. The complex permittivity is obtained from analysis of the incident and the reflected voltage waves. In order to improve accuracy at higher frequencies, the lumped element model is corrected of the wave propagation in the specimen section. The applicability of the method has been verified at frequencies from 100 MHz to 10 GHz on several polymer composite films, 40 mm to 100 mm thick, having a dielectric constant ranging from 4 to 40. When compared to other techniques, TDR provides a more intuitive and direct insight into capacitance density and impedance characteristics, which is very useful in high-frequency characterization of embedded passive devices.

Proceedings Title

Instrumentation and Measurement Technology Conference, 2006, IMTC 2006, Proceedings of the IEEE

Conference Dates

April 24-26, 2006

Conference Location

Sorento, IT

Conference Title

IEEE Conference on Instrumentation and Measurement, IMTC 06

Pub Type

Conferences

Download Paper

Local Download

Keywords

dielectric materials, high frequency measurements, TDR

Citation

Obrzut, J. and Nozaki, R. (2006), TDR Permittivity Measurements of Dielectric Films, Instrumentation and Measurement Technology Conference, 2006, IMTC 2006, Proceedings of the IEEE, Sorento, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852848 (Accessed April 20, 2024)