TY  - CONF
AU  - Jan Obrzut
AU  - R Nozaki
C2  - Instrumentation and Measurement Technology Conference, 2006, IMTC 2006, Proceedings of the IEEE, Sorento, IT
DA  - 2006-05-15
LA  - en
PB  - Instrumentation and Measurement Technology Conference, 2006, IMTC 2006, Proceedings of the IEEE, Sorento, IT
PY  - 2006
TI  - TDR Permittivity Measurements of Dielectric Films
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852848
ER  -