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Systematic Errors in Noise Parameter Determination Due To Imperfect Source Impedance Measurements

Published

Author(s)

Dave K. Walker, Wojciech Wiatr

Abstract

We present a rigorouse two-step analysis of systematic errors in the four-noise parameter determination of a two-port network using the cold-source technique. This analysis is based on an original model that accounts for residual errors in the source impedance measurements. The method employs two linear fractional transforms to decompose the errors into relevant factor sets affecting the parameters in different ways. Analyses performed for a low-noise PHEMT and a microwave amplifier shows that the noise parameters of the low-noise PHEMT are highly vulnerabel to such errors.
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
54
Issue
2

Keywords

Noise, parameter estimation, error analysis, modeling, network analyzer, residual errors, amplifiers, microwave field effect transistors.

Citation

Walker, D. and Wiatr, W. (2005), Systematic Errors in Noise Parameter Determination Due To Imperfect Source Impedance Measurements, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31740 (Accessed July 17, 2024)

Issues

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Created April 4, 2005, Updated January 27, 2020