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Synchrotron Based Surface Science to Probe Polymeric Interfacial Regions

Published

Author(s)

Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Daniel A. Fischer

Abstract

Synchrotron based X-ray absorption spectroscopy was utilized to probe the chemistry and structure of polymers in interfacial regions, including the interfacial regions, including the interfacial composition of filled epoxy composites, and the surface orientation of polymer films. Polymer interfacial properties can be very different than their bulk properties, due to variations in chemical composition, molecular orientation, mobility, crystallinity, and microstructure near the interface. Due to current trends in device miniaturization coupled with increasingly complex material formulations, the interfacial properties of polymers play a critical role in device performance as well as the performance of many general materials systems such as adhesives, encapsulants, foams, filled polymers, and coatings. To understand and control reliability and aging issues associated with polymer interfaces it is important to understand on a fundamental level what controls the properties, structure, and composition of polymers near the interface. This requires advancing measurement technology capable of assessing polymer interfacial properties with improved chemical resolution, spatial resolution, and chemical sensitivity when compared to current technologies.
Proceedings Title
International Conference on Synchrotron Radiation in Materials Science (SRMS-5) | 5th | |
Conference Dates
August 1, 2006
Conference Location
Undefined
Conference Title
International Conference on Synchrotron Radiation in Materials Science

Keywords

interfaces, NEXAFS, polymers, surfaces

Citation

Lenhart, J. and Fischer, D. (2021), Synchrotron Based Surface Science to Probe Polymeric Interfacial Regions, International Conference on Synchrotron Radiation in Materials Science (SRMS-5) | 5th | |, Undefined (Accessed July 23, 2024)

Issues

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Created October 12, 2021