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Surface Extended X-Ray Adsorption Fine Structure Studies of the Si(001) 2x1-Sb Interface

Published

Author(s)

M. Richter, J C. Woicik, P Pianetta, K. E. Miyano, T Kendelewicz, Charles E. Bouldin, W E. Spicer, I. Lindau
Citation
Journal of Vacuum Science and Technology
Volume
A 9
Issue
3

Citation

Richter, M. , Woicik, J. , Pianetta, P. , Miyano, K. , Kendelewicz, T. , Bouldin, C. , Spicer, W. and Lindau, I. (1991), Surface Extended X-Ray Adsorption Fine Structure Studies of the Si(001) 2x1-Sb Interface, Journal of Vacuum Science and Technology (Accessed April 19, 2024)
Created May 31, 1991, Updated October 12, 2021