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Surface Extended-X-Ray-Absorption Fine Structure and Scanning Tunneling Microscopy of Si(001) 2x1-Sb

Published

Author(s)

M. Richter, J C. Woicik, J. Nogami, P Pianetta, A. A. Baski, T Kendelewicz, Charles E. Bouldin, W E. Spicer, C. F. Quate, I. Lindau
Citation
Physical Review Letters
Volume
65
Issue
27

Citation

Richter, M. , Woicik, J. , Nogami, J. , Pianetta, P. , Baski, A. , Kendelewicz, T. , Bouldin, C. , Spicer, W. , Quate, C. and Lindau, I. (1990), Surface Extended-X-Ray-Absorption Fine Structure and Scanning Tunneling Microscopy of Si(001) 2x1-Sb, Physical Review Letters (Accessed April 24, 2024)
Created December 30, 1990, Updated October 12, 2021