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Summary report::second workshop on industrial applications of scanned probe microscopy, May 2-3, 1995

Published

Author(s)

J A Dagata, A C Diebold, C K Shih, R J Colton
Citation
- NIST IR 5752
Report Number
NIST IR 5752

Citation

Dagata, J. , Diebold, A. , Shih, C. and Colton, R. (1995), Summary report::second workshop on industrial applications of scanned probe microscopy, May 2-3, 1995, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.5752 (Accessed June 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 1995, Updated May 19, 2023