Dagata, J.
, Diebold, A.
, Shih, C.
and Colton, R.
(1995),
Summary report::second workshop on industrial applications of scanned probe microscopy, May 2-3, 1995, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.5752
(Accessed July 26, 2024)
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Summary report::second workshop on industrial applications of scanned probe microscopy, May 2-3, 1995
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- NIST IR 5752
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NIST IR 5752
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Created January 1, 1995, Updated May 19, 2023