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PUBLICATIONS

Study of Low-Frequency Charge Pumping on Thin Stacked Dielectrics

Published

Author(s)

C E. Weintraub, Eric M. Vogel, John R. Hauser, Nian Yang, Veena Misra, J. J. Wortman, J J. Ganem, Pascal Masson
Citation
IEEE Transactions on Electron Devices
Volume
48
Issue
12
Pub Type
Journals

Keywords

Charge Pumping, Dielectric, Interface State Nitrogen, MOS, Tunneling

Citation

Weintraub, C. , Vogel, E. , Hauser, J. , Yang, N. , Misra, V. , Wortman, J. , Ganem, J. and Masson, P. (2001), Study of Low-Frequency Charge Pumping on Thin Stacked Dielectrics, IEEE Transactions on Electron Devices (Accessed October 28, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created November 30, 2001, Updated October 12, 2021
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