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Study of Low-Frequency Charge Pumping on Thin Stacked Dielectrics

Published

Author(s)

C E. Weintraub, Eric M. Vogel, John R. Hauser, Nian Yang, Veena Misra, J. J. Wortman, J J. Ganem, Pascal Masson
Citation
IEEE Transactions on Electron Devices
Volume
48
Issue
12

Keywords

Charge Pumping, Dielectric, Interface State Nitrogen, MOS, Tunneling

Citation

Weintraub, C. , Vogel, E. , Hauser, J. , Yang, N. , Misra, V. , Wortman, J. , Ganem, J. and Masson, P. (2001), Study of Low-Frequency Charge Pumping on Thin Stacked Dielectrics, IEEE Transactions on Electron Devices (Accessed April 21, 2024)
Created November 30, 2001, Updated October 12, 2021