This paper describes a method for stitching multiple overlapping interferometric measurements of the equator of a high quality sphere to produce a single profile representing the roundness of the ball. The resulting optical profile measurement is compared with one obtained using a mechanical measurement and it is demonstrated that very good agreement exists between the two independent measurements.
Proceedings Title: Proceedings of SPIE, Specification, Production, and Testing of Optical Components and Systems, Anthony E. Gee, Jean-Francois Houee, Editors
Conference Dates: May 13, 1996
Conference Location: Glasgow, -1
Conference Title: Image Quality and Standards
Pub Type: Conferences
interferometry, roundness, stitching