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Statistics for Electromigration Testing

Published

Author(s)

Harry A. Schafft, J. A. Lechner, B. Sabi, M. Mahaney, R P. Smith
Proceedings Title
Proc., 26th Annual International Reliability Physics Symposium
Conference Dates
April 12-14, 1988
Conference Location
Monterey, CA, USA

Citation

Schafft, H. , Lechner, J. , Sabi, B. , Mahaney, M. and Smith, R. (1988), Statistics for Electromigration Testing, Proc., 26th Annual International Reliability Physics Symposium, Monterey, CA, USA (Accessed April 16, 2024)
Created December 30, 1988, Updated October 12, 2021