@conference{765571, author = {Harry Schafft and J. Lechner and B. Sabi and M. Mahaney and R Smith}, title = {Statistics for Electromigration Testing}, year = {1988}, month = {1988-12-31 00:12:00}, publisher = {Proc., 26th Annual International Reliability Physics Symposium, Monterey, CA, USA}, language = {en}, }