Zhang, N.
, Sedransk, N.
and Jarrett, D.
(2002),
Statistical Uncertainty Analysis of CCEM-K2 Comparisions of Resistance Standards, Statistical Uncertainty Analysis of CCEM-K2 Comparisoons of Resistance Standards, Ottawa, 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30821
(Accessed October 17, 2025)
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Statistical Uncertainty Analysis of CCEM-K2 Comparisions of Resistance Standards
Published
Author(s)
Nien F. Zhang, N Sedransk,
Abstract
Details of the statistical uncertainty analysis applied to key comparison CCEM-K2 are reported. Formulas were derived to determine the uncertainty of the combined difference between the measurements of multiple artifacts by an NMI and the corresponding predictions based on pilot lab measurement. In addition, the uncertainties of the reference value of the key comparison and the degrees of equivalence betweeen two NMI's are obtainedProceedings Title
Statistical Uncertainty Analysis of CCEM-K2 Comparisoons of Resistance Standards
Conference Dates
June 16-21, 2002
Conference Location
Ottawa, 1, CA
Conference Title
Conference on Precision Electromagnetic Measurements
Pub Type
Conferences
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Citation
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Created May 31, 2002, Updated October 12, 2021