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Statistical Uncertainty Analysis of CCEM-K2 Comparisions of Resistance Standards

Published

Author(s)

Nien F. Zhang, N Sedransk, Dean G. Jarrett

Abstract

Details of the statistical uncertainty analysis applied to key comparison CCEM-K2 are reported. Formulas were derived to determine the uncertainty of the combined difference between the measurements of multiple artifacts by an NMI and the corresponding predictions based on pilot lab measurement. In addition, the uncertainties of the reference value of the key comparison and the degrees of equivalence betweeen two NMI's are obtained
Proceedings Title
Statistical Uncertainty Analysis of CCEM-K2 Comparisoons of Resistance Standards
Conference Dates
June 16-21, 2002
Conference Location
Ottawa, 1, CA
Conference Title
Conference on Precision Electromagnetic Measurements

Citation

Zhang, N. , Sedransk, N. and Jarrett, D. (2002), Statistical Uncertainty Analysis of CCEM-K2 Comparisions of Resistance Standards, Statistical Uncertainty Analysis of CCEM-K2 Comparisoons of Resistance Standards, Ottawa, 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30821 (Accessed May 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 31, 2002, Updated October 12, 2021