Stone, R.
, Walter, F.
, Blackburn, D.
, Pella, P.
and Kraner, H.
(1981),
A STANDARD TECHNIQUE FOR MEASURING WINDOW ABSORPTION AND OTHER EFFICIENCY LOSSES IN SEMICONDUCTOR ENERGY-DISPERSIVE X-RAY SPECTROMETRY, X-Ray Spectrometry
(Accessed October 10, 2024)
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A STANDARD TECHNIQUE FOR MEASURING WINDOW ABSORPTION AND OTHER EFFICIENCY LOSSES IN SEMICONDUCTOR ENERGY-DISPERSIVE X-RAY SPECTROMETRY
Published
Author(s)
R E. Stone, F J. Walter, , P A. Pella, H W. Kraner
Citation
X-Ray Spectrometry
Volume
10
Issue
2
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1981, Updated February 17, 2017