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A STANDARD TECHNIQUE FOR MEASURING WINDOW ABSORPTION AND OTHER EFFICIENCY LOSSES IN SEMICONDUCTOR ENERGY-DISPERSIVE X-RAY SPECTROMETRY

Published

Author(s)

R E. Stone, F J. Walter, Douglas H. Blackburn, P A. Pella, H W. Kraner
Citation
X-Ray Spectrometry
Volume
10
Issue
2

Citation

Stone, R. , Walter, F. , Blackburn, D. , Pella, P. and Kraner, H. (1981), A STANDARD TECHNIQUE FOR MEASURING WINDOW ABSORPTION AND OTHER EFFICIENCY LOSSES IN SEMICONDUCTOR ENERGY-DISPERSIVE X-RAY SPECTROMETRY, X-Ray Spectrometry (Accessed April 21, 2024)
Created January 1, 1981, Updated February 17, 2017