TY  - JOUR
AU  - Stone, R
AU  - Walter, F
AU  - Blackburn, Douglas
AU  - Pella, P
AU  - Kraner, H
C2  - X-Ray Spectrometry
DA  - 1981-01-01
LA  - en
M1  - 10
PB  - X-Ray Spectrometry
PY  - 1981
TI  - A STANDARD TECHNIQUE FOR MEASURING WINDOW ABSORPTION AND OTHER EFFICIENCY LOSSES IN SEMICONDUCTOR ENERGY-DISPERSIVE X-RAY SPECTROMETRY
ER  -