Humphreys, J.
and Chappell, S.
(1979),
Standard procedure for use of thermoluminescence dosimetry in radiation-hardness testing of electronic devices:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.79-1723
(Accessed April 25, 2024)
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Standard procedure for use of thermoluminescence dosimetry in radiation-hardness testing of electronic devices:
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Author(s)
,
Citation
- NBS IR 79-1723
Report Number
NBS IR 79-1723
Pub Type
NIST Pubs
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Created January 1, 1979, Updated May 19, 2023