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Standard procedure for use of thermoluminescence dosimetry in radiation-hardness testing of electronic devices:

Published

Author(s)

J C Humphreys, S E Chappell
Citation
- NBS IR 79-1723
Report Number
NBS IR 79-1723

Citation

Humphreys, J. and Chappell, S. (1979), Standard procedure for use of thermoluminescence dosimetry in radiation-hardness testing of electronic devices:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.79-1723 (Accessed April 18, 2024)
Created January 1, 1979, Updated May 19, 2023