TY  - GEN
AU  - J C Humphreys
AU  - S E Chappell
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1979-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.79-1723
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1979
TI  - Standard procedure for use of thermoluminescence dosimetry in radiation-hardness testing of electronic devices:
ER  -