Bullis, W.
(1974),
Standard measurements of the resistivity of silicon by the four-probe method:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.74-496
(Accessed October 5, 2024)
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Standard measurements of the resistivity of silicon by the four-probe method:
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- NBS IR 74-496
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NBS IR 74-496
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NIST Pubs
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Created January 1, 1974, Updated May 19, 2023