TY  - GEN
AU  - Bullis, W Murray
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1974-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.74-496
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1974
TI  - Standard measurements of the resistivity of silicon by the four-probe method:
ER  -