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Sources of Uncertainty in a DVM-Based Measurement System for a Quantized Hall Resistance Standard

Published

Author(s)

Kevin C. Lee, Marvin E. Cage, P. S. Rowe
Citation
Journal of Research (NIST JRES) -
Volume
99
Issue
3

Citation

Lee, K. , Cage, M. and Rowe, P. (1994), Sources of Uncertainty in a DVM-Based Measurement System for a Quantized Hall Resistance Standard, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15964 (Accessed April 20, 2024)
Created April 30, 1994, Updated October 12, 2021