Jia, J.
, Callcott, T.
, O'brien, W.
, Dong, Q.
, Mueller, D.
, Rubensson, J.
, Ederer, D.
, Tan, Z.
, Namavar, F.
and Budnick, J.
(1991),
A Soft X-Ray Emission Investigation of Cobalt Implanted Silicon Crystals, Journal of Applied Physics
(Accessed May 9, 2025)
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A Soft X-Ray Emission Investigation of Cobalt Implanted Silicon Crystals
Published
Author(s)
J J. Jia, T A. Callcott, W L. O'brien, Q -. Dong, D R. Mueller, J E. Rubensson, D L. Ederer, Z Tan, F Namavar, J I. Budnick
Citation
Journal of Applied Physics
Volume
69
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1991, Updated February 17, 2017