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A Soft X-Ray Emission Investigation of Cobalt Implanted Silicon Crystals

Published

Author(s)

J J. Jia, T A. Callcott, W L. O'brien, Q -. Dong, D R. Mueller, J E. Rubensson, D L. Ederer, Z Tan, F Namavar, J I. Budnick
Citation
Journal of Applied Physics
Volume
69

Citation

Jia, J. , Callcott, T. , O'brien, W. , Dong, Q. , Mueller, D. , Rubensson, J. , Ederer, D. , Tan, Z. , Namavar, F. and Budnick, J. (1991), A Soft X-Ray Emission Investigation of Cobalt Implanted Silicon Crystals, Journal of Applied Physics (Accessed June 15, 2024)

Issues

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Created January 1, 1991, Updated February 17, 2017